Publications
2013
An Interferometric scanning microwave microscope and calibration method for subf-F microwave measurements
Three-dimensional finite-element simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
2014
Calibrated complex impedance and permitivity measurements with scanning microwave microscopy
High speed e-beam lithography for gold nanoarray fabrication and use in nanotechnology
Quantitative impedence characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope
2015
Charge-order domain walls with enhanced conductivity in a layered manganite
Modeling and de-embedding the interferometric scanning microwave microscopy by means of dopant
Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy
2016
Microwave imaging at the nanoscale: quantitative measurements for semiconductor devices, materials science and bio-applications
An advanced impedence calibration method for nanoscale microwave imaging
Nanoscale dielectric microscopy of non-planar samples bu lift-mode electrostatic force microscopy
A 17 GHz molecular rectifier
Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy
Nanoscale Electric Permittivity of Single Bacterial Cells at Gigahertz Frequencies by Scanning Microwave Microscopy
Internal Hydration Properties of Single Bacterial Endospores Probed by Electrostatic Force Microscopy
De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy
A broadband toolbox for scanning microwave microscopy transmission measurements
Scanning microwave microscopy techniques for nanoscale characterization of magnetic materials
2017
Full-wave broadband modeling ofnear field scanning microwave microscopy
Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy
Calibrated nanoscale dopant profiling and capacitance of a high-voltage lateral MOS transistor at 20 GHz using scanning Microwave Microscopy
Nondestructive imaging of atomically thinnanostructures buried in silicon